| DATE | HS_CODE | Product Description | Trademark | Country | Net Weight | Statistical Cost | Place | Shipper Name | Consignee Name |
|---|
| 2017-09-07 | 9012909000 | OF ELECTRON MICROSCOPE - contact probe atomic force microscope SENSING SURFACE SAMPLE MINIATURE rectangular platform with a needle on the end GEOMETRY: STANDARD, PROBE HEIGHT: 10 - 15 mkm, rake angle: 25 + 2,5 °, a clearance angle 15 | *** | UNITED KINGDOM | 0.27 | 1789,63 | ST PETERSBURG | ***** | ***** |
| 2017-09-11 | 9012909000 | Part of the analytical scanning electron microscope: the electron cathode tungsten filament to produce a stream of particles of high energy in the electron microscope column JCM-6000 SERIES: * NOT REF NOT HFD. Cathodes with VENELTOM, for desktop Raster | *** | JAPAN | 0.9 | 4326,69 | *** | ***** | ***** |
| 2017-09-15 | 9012909000 | PARTS AND ACCESSORIES MICROSCOPES -part electron microscope / NOT RADIOFREQUENCY EQUIPMENT AND VYSOKOCH.USTR-VA /: F / G, LMI, GA69, CA, LONGLIFE, ION SOURCE gallium ion gun ELECTRON MICROSCOPE QUANTA RBLD, NGSEM OPTICS MODULE, cathode assembly FEG ELEC | *** | UNITED STATES | 22.4 | 34191,6 | *** | ***** | ***** |
| 2017-09-15 | 9012909000 | PARTS AND ACCESSORIES MICROSCOPES -part electron microscope / NOT RADIOFREQUENCY EQUIPMENT AND VYSOKOCH.USTR-VA /: PCB ASSY, DEFLECTION AMP, the final stage CONTROL SYSTEM SCAN ION BEAM QUANTA 3D ADDITIONAL WEHNELT ASSEM BLY, FIC DEVICE | *** | UNITED STATES | 0.43 | 11141,77 | *** | ***** | ***** |
| 2017-09-15 | 9012909000 | PARTS AND ACCESSORIES MICROSCOPES -part electron microscope / NOT RADIOFREQUENCY EQUIPMENT AND VYSOKOCH.USTR-VA /: F / G, FEG RETIP, cathodes with electron field emission MICROSCOPE FEI CZECH REPUBLIC SRO FEI 23900 1 | *** | UNITED STATES | 6.1 | 5295 | *** | ***** | ***** |
| 2017-09-21 | 9012909000 | OF ELECTRON MICROSCOPE - CONTROLLER E-beam optics NEON SYSTEMS AND ELECTRONIC MICROSCOPES CROSSBEAM printed circuit boards textolite basis with active / passive components and microprocessors CARL ZEISS MICROSCOPY GMBH ZEIS | *** | SPAIN | 3.2 | 8475,2 | ST PETERSBURG | ***** | ***** |
| 2017-09-25 | 9012909000 | Spare parts for scanning electron microscopy TESCAN VEGA 3 LMH-electron gun PROVIDED NOT FOR SALE, AS A REPLACEMENT WARRANTY, are not equipped with wireless functionality, electronic CP YOU AND HIGH FREQUENCY ELECTRONIC ustroytvo | *** | *** | 6 | 3654,21 | *** | ***** | ***** |
| 2017-10-04 | 9012909000 | PARTS AND ACCESSORIES MICROSCOPES -part electron microscope / NOT RADIOFREQUENCY EQUIPMENT AND VYSOKOCH.USTR-VA /: SET 10 FILAMENTS TUN-set of 10 cathodes for scanning electron microscopy (NAB EACH OF 10 PCS..) - Only 10 of NAB. AGAR SCIENTIFIC LTD | *** | SLOVAKIA | 1.2 | 2747,59 | *** | ***** | ***** |
| 2017-10-04 | 9012909000 | PARTS AND ACCESSORIES MICROSCOPES -part electron microscope / NOT RADIOFREQUENCY EQUIPMENT AND VYSOKOCH.USTR-VA /: F / G, LMI, GA69, CA, LONGLIFE-ION SOURCE gallium ion gun ELECTRON MICROSCOPE QUANTA FEI COMPANY FEI 16830 1 | *** | SLOVAKIA | 0.01 | 2483,92 | *** | ***** | ***** |
| 2017-10-09 | 9012909000 | Detector wavelength dispersive microanalysis INCA WAVE for electron microscopy complete with accessories: SENSOR X-ray spectrum (serial number: 45618) kit. It is designed to receive a secondary electron, scanning X-ray spectrum | *** | UNITED KINGDOM | 35.4 | 12859,61 | *** | ***** | ***** |