DATE | HS_CODE | Product Description | Trademark | Country | Net Weight | Statistical Cost | Place | Shipper Name | Consignee Name |
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2017-09-01 | 8536901000 | Contact elements for wires and cables PROBE-metallic contact in the form of pins, is used to test semiconductor wafers and devices for voltage 5V NIZKOVOLTNYE.NE is a means of fire automatics. : F89917K250U350S1, CONTACT dammed | *** | UNITED STATES | 0.4 | 695,66 | *** | ***** | ***** |
2017-09-04 | 8486209009 | The DTX - INSTALLATION scribing and separation into chips - 1 PCS. HOW IT WORKS: using a diamond cutter to move along the surface of semiconductor wafers up to 200 mm along the line of scribing, separated by a single crystal at the surface: semiconductors | *** | UNITED STATES | 650 | 454845,99 | *** | ***** | ***** |
2017-09-05 | 8486209003 | To remove the photoresist AND TREATMENT OF SEMICONDUCTOR PLATES: INSTALLATION plasma clearance ATTO, at a specified EQUIPMENT is designed for plasma-chemical processing of semiconductor wafers and substrates up to 200 mm in diameter for issl | *** | GERMANY | 58 | 10124,18 | *** | ***** | ***** |
2017-09-05 | 8543709000 | EQUIPMENT having individual functions, for use in manufacture of optical fiber BATH ULTRASONIC TECHNIQUE H RK 102 is a device for cleaning (washing) of semiconductor wafers, CRYSTALS, OP | *** | GERMANY | 17 | 4369,44 | *** | ***** | ***** |
2017-09-06 | 9011101000 | Stereoscopic microscope, SERIES BS-3070, is designed to monitor PCBs and their repair. Not for military purposes. NOT FOR MEDICINE. EQUIPPED STAND FOR peremscheniya semiconductor wafers and has a built LED lighting. SUPPLIED | *** | CHINA | 33 | 3411 | *** | ***** | ***** |
2017-09-06 | 9030820000 | Instruments and apparatus for measuring or checking semiconductor wafers or devices for civil destination without the BLUETOOTH AND WIFI, without the encryption function of multifunction calibrators // Each cpl C: Informational materials, POWER CORD, envelopes, SWI | *** | VIETNAM | 27.27 | 6004,31 | *** | ***** | ***** |
2017-09-06 | 8536901000 | Contact elements for wires and cables PROBE-metallic contact in the form of pins, is used to test semiconductor wafers and devices for voltage 5V NIZKOVOLTNYE.NE is a means of fire automatics. : Spring-loaded terminals IN CONTACT | *** | CHINA | 0.4 | 715,11 | *** | ***** | ***** |
2017-09-06 | 8536901000 | Contact elements for wires and cables PROBE-metallic contact in the form of pins, is used to test semiconductor wafers and devices for voltage 5V NIZKOVOLTNYE.NE is a means of fire automatics. : Spring-loaded terminals IN CONTACT | *** | CHINA | 0.6 | 867,18 | *** | ***** | ***** |
2017-09-06 | 8538901900 | OF PROBES (prober) to test semiconductor wafers: GKS-075 291 064 A 1500 L TEST PROBE / GKS-075 291 064 A 1500 L prober, used in electronics, COLLECTED FOR TESTING printed circuit assemblies by contacting TESTS | *** | ITALY | 1.45 | 4304,09 | *** | ***** | ***** |
2017-09-07 | 8467298509 | ELECTRIC vacuum pickup ART.AV-5000-MW8-220 - 6 pcs. POWER SUPPLY: 220 V AC (50-60 Hz). APPLY FOR RETENTION AND HANDLING thin semiconductor wafers to 8 inches, prevent them from touching any electric or | *** | UNITED STATES | 9 | 3190,31 | *** | ***** | ***** |