DATE | HS_CODE | Product Description | Trademark | Country | Net Weight | Statistical Cost | Place | Shipper Name | Consignee Name |
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2017-09-04 | 9022190000 | Equipment based on X-ray: X-ray fluorescence spectrometer portable analyzer-industrial classes for chemical analysis of metals, alloys and minerals MODELS SCIAPS X SERIES - 1 unit is designed to measure M | *** | UNITED STATES | 5 | 21000 | *** | ***** | ***** |
2017-09-21 | 9022190000 | Equipment based on X-rays. Not for military purposes. LABORATORY EQUIPMENT. DOES NOT CONTAIN radioactive sources. Portable X-ray fluorescence analyzer SPECTROMETER NITON XL2 MODEL 500 - ANALYZER METALS, includes a set of P | *** | ITALY | 35 | 95574 | MOSCOW | ***** | ***** |
2017-09-26 | 9022190000 | Equipment based on X-rays. APPLICATION: quantitative nondestructive elemental analysis of chemical elements RENTGENOFLUORISTSENTNOY BY MASS spectrometry for quantitative analysis of metals: PORTABLE RENTGENOFLUOR | *** | UNITED STATES | 6 | 14352 | *** | ***** | ***** |
2017-09-27 | 9022190000 | ETC. Equipment based on X-ray PRIM. On tap. Branches of industry-STI 900-500013 ANALUZED SYSTEM / 900-500013 PORTABLE XRF analyzer SCIAPS X SERIES, are designed to measure mass fraction of chemical elements in METAL | *** | UNITED STATES | 6.3 | 36776,45 | *** | ***** | ***** |
2017-09-27 | 9022190000 | XRF portable analyzers metals and alloys. INTENDED FOR RESEARCH LABORATORY materialographic. DOES NOT CONTAIN radioactive sources: X-ray fluorescence analyzer (spectrometer) With the software installed | *** | UNITED STATES | 7 | 12532,66 | *** | ***** | ***** |
2017-09-28 | 9022190000 | PORTABLE XRF spectrometer "SPECTRO XSORT" ZAV.â„– 144902-1 PCS is designed for sorting and grading SCRAP METAL, analyzing the composition of rocks, ANALYSIS OF OILS Determination of low sulfur concentration in the THEN PL | *** | GERMANY | 63 | 52737,32 | *** | ***** | ***** |
2017-10-02 | 9022190000 | PORTABLE XRF spectrometer "SPECTRO XSORT" ZAV.â„– 144961-1 PCS is designed for sorting and grading SCRAP METALS INCLUDING X-ray tube to excite the spectrum, semiconductor SDD detectors: Integrated EH | *** | GERMANY | 28 | 37365,42 | *** | ***** | ***** |
2017-10-03 | 9022190000 | Energy dispersive X-ray fluorescence spectrometry TABLE polarized X rays "SPECTRO XEPOS" ZAV.â„– 145062-1 PCS, is designed to determine HIM.SOSTAVA geological rocks, metals, alloys and slag as: ZN POROSHKOOBRA | *** | GERMANY | 115 | 107993,87 | *** | ***** | ***** |
2017-10-04 | 9022190000 | Equipment based on X-rays. APPLICATION: quantitative nondestructive elemental analysis of chemical elements RENTGENOFLUORISTSENTNOY BY MASS spectrometry for quantitative analysis of metals: PORTABLE RENTGENOFLUOR | *** | UNITED STATES | 6 | 23682 | *** | ***** | ***** |
2017-10-05 | 9022190000 | Equipment based on X-rays. APPLICATION: quantitative nondestructive elemental analysis of chemical elements RENTGENOFLUORISTSENTNOY BY MASS spectrometry for quantitative analysis of metals: PORTABLE RENTGENOFLUOR | *** | UNITED STATES | 6 | 21482 | *** | ***** | ***** |