DATE | HS_CODE | Product Description | Trademark | Country | Net Weight | Statistical Cost | Place | Shipper Name | Consignee Name |
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2017-09-13 | 9030310000 | MEASURING INSTRUMENTS UNIVERSAL without a recording device- Digital Multimeter: Digital Multimeter. Designed to measure voltage, resistance, electric capacity. EQUIPPED tentacles to measure temperature and silicone wiring. The PROTECT | *** | CHINA | 3 | 530,97 | BERLIN | ***** | ***** |
2017-10-06 | 9030100000 | SILICON SENSOR VITUS H20 SDD- 2 PCS. COMPLETE WITH FLAT CABLE FOR AMP with connector FFC-2 pcs .. USED FOR X-ray detection with integrated FETs. INTERACTION WITH X-ray quanta with the sensor H | *** | GERMANY | 0.4 | 13547,34 | *** | ***** | ***** |
2017-10-13 | 9030908500 | Parts of equipment for measuring ionizing radiation, a radiation source NO: PIPS Detector for dosimetric DEVICES ABPM 201. Detector is a sealed metal cylinder with an interior silicon D | *** | FRANCE | 0.8 | 7054,52 | *** | ***** | ***** |
2017-10-16 | 9030320009 | MEASURING INSTRUMENTS UNIVERSAL with a recording device CIVIL NO WIFI and the BLUETOOTH, WITHOUT REGISTRATION encryption function of digital multimeters // Each cpl C: 1 * software, cable, 1 * thermocouple, 1 * Silicone Test OL | *** | CHINA | 24.9 | 3891,78 | *** | ***** | ***** |
2017-10-17 | 9030820000 | APPARATUS FOR MEASURING PHYSICAL PROPERTIES (surface resistivity) of the semiconductor silicon wafer by a contact method (without radioactive source) during their manufacture, the kit WITH SPECIAL EQUIPMENT FOR OUT | *** | UNITED KINGDOM | 31 | 23929,11 | *** | ***** | ***** |
2017-10-17 | 9030820000 | APPARATUS FOR MEASURING PHYSICAL PROPERTIES (surface resistivity) of the semiconductor silicon wafer by a contact method (without radioactive source) during their manufacture, the kit WITH SPECIAL EQUIPMENT FOR OUT | *** | UNITED KINGDOM | 28.5 | 23929,11 | *** | ***** | ***** |
2017-10-18 | 9030100000 | MEASURING PARAMETERS ionizing radiation SOD.RADIOAKT.ISTOCHNIKA NOT NOT APPLY TO RADIO and high frequency devices, NOT MILITARY silicon semiconductor detectors Alpha particles are sensitive elements of the laboratory | *** | BELGIUM | 2 | 15779,88 | *** | ***** | ***** |
2017-11-26 | 9030908500 | PARTS EQUIPMENT resistivity measurements for voltage 5V, from the composition of automatic MEASUREMENT electrophysical parameters of semiconductor silicon wafers SSM: | SEMILAB, | *** | 0.2 | 624,23 | Moscow Sheremetyevo | ***** | ***** |