| DATE | HS_CODE | Product Description | Trademark | Country | Net Weight | Statistical Cost | Place | Shipper Name | Consignee Name |
|---|
| 2017-09-01 | 8536901000 | Contact elements for wires and cables PROBE-metallic contact in the form of pins, is used to test semiconductor wafers and devices for voltage 5V NIZKOVOLTNYE.NE is a means of fire automatics. : F89917K250U350S1, CONTACT dammed | *** | UNITED STATES | 0.4 | 695,66 | *** | ***** | ***** |
| 2017-09-06 | 8536901000 | Contact elements for wires and cables PROBE-metallic contact in the form of pins, is used to test semiconductor wafers and devices for voltage 5V NIZKOVOLTNYE.NE is a means of fire automatics. : Spring-loaded terminals IN CONTACT | *** | CHINA | 0.4 | 715,11 | *** | ***** | ***** |
| 2017-09-06 | 8536901000 | Contact elements for wires and cables PROBE-metallic contact in the form of pins, is used to test semiconductor wafers and devices for voltage 5V NIZKOVOLTNYE.NE is a means of fire automatics. : Spring-loaded terminals IN CONTACT | *** | CHINA | 0.6 | 867,18 | *** | ***** | ***** |
| 2017-09-06 | 8536508000 | ELECTRIC SWITCHES, FOR RADIO EQUIPMENT ROTARY wafer switches 2P6POS, CK 1030. SEPARATE wafer rotary switch to maximum 12 switching positions. Mode switching without short-circuiting. CONNECTED | *** | GERMANY | 0.46 | 63,49 | *** | ***** | ***** |
| 2017-09-14 | 8536900100 | Pre-assembled elements for electric circuits for voltage up to 1000 V for warranty service APPLIANCES COMPANY "SAMSUNG": BUTTON silicon wafer metallized contacts 5B FOR SAMSUNG E TABLETS | *** | VIETNAM | 0.23 | 791,38 | *** | ***** | ***** |
| 2017-09-20 | 8536902000 | PROBES FOR VERIFICATION wafer, a standard spring with a pitch USE 100um, voltage 10V, PROBE MATERIAL - TUNGSTEN: Used as a single contact in the contact assemblies (PROBE HEAD) ELEKETRONNYH testers. PROBES CT | *** | JAPAN | 0.3 | 1462,98 | *** | ***** | ***** |
| 2017-09-20 | 8536508000 | ELECTRIC SWITCH FOR ROTARY EQUIPMENT OF RADIO wafer switches 1P12POS, CK 1029. BACKGROUND 1. NUMBER OF POLES 1. SWITCH locking angle 12 of 30 ° switching capability 150 MA @ 250 V Resistance to | *** | GERMANY | 0.68 | 189,97 | *** | ***** | ***** |
| 2017-09-21 | 8536902000 | PROBES FOR VERIFICATION wafer for voltage up to 1000 V: part of the probe station. They are an integral part and not intended for independent use. HAS RADIOELKTR.I VYSOKOCHAST.SRE-B. PROBE, 50 GHz, CONFIGURATION G | *** | UNITED STATES | 4.4 | 34719,54 | *** | ***** | ***** |
| 2017-09-30 | 8536902000 | PROBES FOR VERIFICATION wafer for voltage up to 1000 V, NOT SCRAP ELECTRIC: prober (PROBE) USED AS PART TO CREATE A snap-ins, which allows you to CHECK wafer (PRINTED UZL | *** | GERMANY | 0.2 | 596,35 | *** | ***** | ***** |
| 2017-11-03 | 8536902000 | PROBES FOR VERIFICATION wafer, a standard spring with a pitch USE 100um, voltage 10V, PROBE MATERIAL - tungsten. NOT SCRAP ELECTRIC. | ABSENT | JAPAN | 0.27 | 1853,57 | TW TAO YUAN AIRPORT | ***** | ***** |