| DATE | HS_CODE | Product Description | Trademark | Country | Net Weight | Statistical Cost | Place | Shipper Name | Consignee Name |
|---|
| 2017-09-06 | 9030820000 | Instruments and apparatus for measuring or checking semiconductor wafers or devices for civil destination without the BLUETOOTH AND WIFI, without the encryption function of multifunction calibrators // Each cpl C: Informational materials, POWER CORD, envelopes, SWI | *** | VIETNAM | 27.27 | 6004,31 | *** | ***** | ***** |
| 2017-09-06 | 9030902000 | PART apparatus for measuring a semiconductor wafer probe cards COMPLETE WITH PROBKARTOY TEST wafer in automatic mode logic analyzer AGILENT 93000: //-ART.8969WA41H018 FEINMETALL GMBH FEINMETALL 1 | *** | FRANCE | 6 | 900 | MOSCOW | ***** | ***** |
| 2017-09-12 | 9030820000 | Equipment to check the wafer, universal diagnostic system characterized by the widest range of test instruments for the detection of MAPK. AT UPAK. Equipment to check the wafer, universal | *** | UNITED KINGDOM | 37 | 13395,94 | *** | ***** | ***** |
| 2017-09-12 | 9030820000 | Equipment to check the wafer, portable 40-pin DIGITAL TESTER printed circuit boards, CHIPMASTER COMPACT PROFESSIONAL, FOR VOLTAGE 6V, NOT CONTAIN REE and HFD; HF, NO MILITARY ART .: 410001 - 1 PCS, Mark.. AT UPAK. APPLIANCE | *** | UNITED KINGDOM | 0.2 | 360,24 | *** | ***** | ***** |
| 2017-09-13 | 9030820000 | Instruments and apparatus for measuring or checking semiconductor wafers or the device is used as a component of other technical equipment and not intended for independent use: Printed Evaluation Boards. USED ​​FOR developers | *** | MALAYSIA | 0.1 | 111,88 | *** | ***** | ***** |
| 2017-09-19 | 9030820000 | Instruments and apparatus for measuring or checking semiconductor wafers or devices / systems for measuring the parameters of mixed signals V93000, SERIES SOC, SERIAL NUMBER MY04603123, YEAR 2017: IN THE COMPOSITION OF MODULE FOR WATER COOLING SYSTEM | *** | MALAYSIA | 950 | 282533,61 | *** | ***** | ***** |
| 2017-09-22 | 9030902000 | PART apparatus for testing semiconductor wafers, used in microelectronics for parametric testing of the system operation check wafer (specifying the performance) (DOES NOT CONTAIN RADIO ELECTRONIC MODULE | *** | DENMARK | 7.7 | 3896,49 | *** | ***** | ***** |
| 2017-10-03 | 9030820000 | Instruments and apparatus for measuring or checking semiconductor wafers or the device:. POSTAV.V RAZOBRAN.VIDE PARTLY FOR TRANSPORTATION FACILITIES, HAS RADIOELKTR.I VYSOKOCHAST.SRE-in, not the military. PURPOSE. EPS150TRIAX triaxial probe station PRETSIZ | *** | GERMANY | 112 | 33390,05 | *** | ***** | ***** |
| 2017-10-03 | 9030902000 | Parts intended exclusively for testing equipment for semiconductor wafers - PROBE CARD GEN2: ART. RK25906-01. PROBE CARD is a board made of fiberglass in an aluminum housing. The card is equipped with a needle pin | *** | UNITED STATES | 0.27 | 4782,44 | *** | ***** | ***** |
| 2017-10-03 | 9030902000 | Part for testing equipment for semiconductor wafers - PROBE CARD TORONTO ART. RK29490-01. PROBE CARD is a board made of fiberglass with aluminum case in BLOCK plugs (SMA) FOR CONNECTION | *** | UNITED STATES | 0.13 | 3003,92 | *** | ***** | ***** |